Measurement uncertainties of size, shape, and surface measurements using transmission electron microscopy of near-monodisperse, near-spherical nanoparticles
De Temmerman, Pieter-Jan Lammertyn, Jeroen De Ketelaere, Bart Kestens, Vikram Roebben, Gert
De Temmerman, Pieter-Jan
Lammertyn, Jeroen
De Ketelaere, Bart
Kestens, Vikram
Roebben, Gert
Citations
Altmetric:
Abstract
Description
Date
2014-01-01
Journal Title
Journal ISSN
Volume Title
Publisher
Chapter title
Publication type
Peer reviewed scientific article
Collections
Research Projects
Organizational Units
Journal Issue
Keywords
Transmission electron microscopy Method validation Reference material Silica nanoparticles Measurement uncertainty Nanometrology