Semi-automatic size measurement of primary particles in aggregated nanomaterials by transmission electron microscopy
De Temmerman, Pieter-Jan Lammertyn, Jeroen
De Temmerman, Pieter-Jan
Lammertyn, Jeroen
Citations
Altmetric:
Abstract
Description
Date
2014-01-07
Journal Title
Journal ISSN
Volume Title
Publisher
Chapter title
Publication type
Peer reviewed scientific article
Collections
Research Projects
Organizational Units
Journal Issue
Keywords
Transmission electron microscopy Image analysis Aggregate Nanomaterial Primary particles Fractal analysis